Industry News

New technique shows how photodetectors can be efficiently coupled to silicon waveguides.

Researchers use temporal analog of a spatial lens to integrate an ultrafast source onto a lithium niobate chip.

Microscopy data suggest that degradation starts from grain boundaries and propagates inwards.

Work showing how exoskeleton adaptations enable a primitive arthropod’s vision could inform design of materials and devices today.

A new approach to producing a series of laser pulses delivers reliable optical pulses without sacrificing power or stability.

Erbium atoms embedded in silicon can emit in a narrow range and at fairly high temperatures.

Lithography system integrator maker jumps in value following latest management update.

Webinar Date/Time: Tuesday, November 29th, 2022 at 11am EST|8am PST|4pm GMT|5pm CET

The Netherlands’ Photonic Integration Technology Center (PITC) has launched a dedicated metrology program, aimed at developing design-for-test methodologies and new product characterization and test automation tools. Within the PITC, which itself looks to accelerate the uptake of integrated photonics by bridging the divide between research and application, the metrology program consortium includes integrated photonics designers, manufacturers, and product suppliers, as well as automated test equipment suppliers.

The program kicked off in September and remains open to international companies as a neutral platform for photonics metrology development.

The development of the center targets the sizeable effect integrated...